@entry{maj-rut-06-aa,
  author = {JD Ma and RA Rutenbar},
  title = {Fast interval-valued statistical modeling of interconnect and effective capacitance},
  journal = {... on Computer-Aided Design of Integrated ...,},
  volume = {},
  number = {},
  pages = {},
  year = 2006,
  month = ,
  doi = {},
  comment = {},
  abstract = {},
  url = {{\url{https://ieeexplore.ieee.org/abstract/document/1610735/?casa_token=Ws-PkBA0xZwAAAAA:FkhvwCHyvu_HctCSchQFx3ueSHWP24UKoq0QuW5qdcOS2pObfAlEsgx6anUq0P9RdZfF4ADj}}},
  quotes = {... , using the affine arithmetic that ... affine arithmetic do a workable job of modeling the most likely part of the real distribution. As explained in Section II-B, however, the new affine arithmetic ...}
}