@entry{bar-kar-luw-sal-hed-olb-rad-sch-12-aa-robcirc,
  author = {M Barke and M Kaergel and W Lu and F Salfelder...},
  title = {Robustness validation of integrated circuits and systems},
  journal = {2012 4th Asia ...,},
  volume = {},
  number = {},
  pages = {},
  year = 2012,
  month = ,
  doi = {},
  comment = {},
  abstract = {},
  url = {{\url{https://ieeexplore.ieee.org/abstract/document/6320491/}}},
  quotes = {... These include the robustness evaluation of digital circuits under aging effects, such as NBTI; the robustness modeling of analog and mixed signal circuits using affine arithmetic; and the ...}
}