@entry{nos-bas-sad-19-aa,
  author = {N Nosrati and K Basharkhah and R Sadeghi...},
  title = {Making System Level Test Possible by a Mixed-mode, Multi-level, Integrated Modeling Environment},
  journal = {2019 IEEE East ...,},
  volume = {},
  number = {},
  pages = {},
  year = 2019,
  month = ,
  doi = {},
  comment = {},
  abstract = {},
  url = {{\url{https://ieeexplore.ieee.org/abstract/document/8884423/?casa_token=n2uiUVWAB9YAAAAA:fwv0XXpzC8XQzPS0x96BG0g2Mnfu7iMIKkku2VumNdeMkWrh0zj_SI5PLmDPqAhVpV2gF7q2}}},
  quotes = {... As shown, MDSI faults are injected for the interconnects, Affine Arithmetic uncertainties are used for faults in the analog components, stuck-at faults and other more abstract functional ...}
}