@entry{bar-kae-luw-sal-12-aa,
  author = {M Barke and M Kaergel and W Lu and F Salfelder...},
  title = {Robustness validation of integrated circuits and systems},
  journal = {2012 4th Asia ...,},
  year = 2012,
  url = {{\url{https://ieeexplore.ieee.org/abstract/document/6320491/}}},
  quotes = {... These include the robustness evaluation of digital circuits under aging effects, such as NBTI; the robustness modeling of analog and mixed signal circuits using affine arithmetic; and the ...}
}