@entry{bar-kar-olb-sch-14-aa-robcirc,
  author = {M Barke and M Kaergel and M Olbrich...},
  title = {Robustness measurement of integrated circuits and its adaptation to aging effects},
  journal = {Microelectronics ...,},
  volume = {},
  number = {},
  pages = {},
  year = 2014,
  month = ,
  doi = {},
  comment = {},
  abstract = {},
  url = {{\url{https://www.sciencedirect.com/science/article/pii/S0026271414000286?casa_token=Y0eYH1MhEYAAAAAA:FSlYwRCxJFNfRav-NP51ycYRbrtoofiHbs7_ZYVgIEbiZcpALzygJt3y66y8wKJKi4vRKMPE}}},
  quotes = {... digital circuits on gate level and their robustness against degradation due to aging effects like NBTI or HCI and the analysis of analog/mixed-signal circuits using affine arithmetic for ...}
}